Analysis services

Our inhouse laboratory offers various options for dedicated coating analysis. We use the following technologies and systems:

• For XRR, XRD and GID measurement to analyse roughness, layer thickness, density and structure we use a Bruker D8 ADVANCE ECO, see specification.
• X-ray spectrometry (XRF) for element analysis is done by a Bruker AXS S4 Pioneer, see specification.
• A Perkin Elmers Lambda 950 UV/ViS Spectrometer is used for transmission/reflectivity measurements in the wavelength range 175 – 3300 nm, see specification.

These systems are used for routine quality assurance.

Of course we also offer analysis services for external samples. Feel free to asked us for more information.